Magnetic force microscopy: The state of the art, perspectives, and challenges

Session

PST.8 - Scanning Probe microscopy:imaging and beyond

Authors

Dr. Daniele Passeri (1), Prof. Marco Rossi (1)

Affiliations

1. University of Rome Sapienza, Department of Basic and Applied Sciences for Engineering

Keywords

magnetic force microscopy

atomic force microscopy

magnetic properties

magnetic nanomaterials

Abstract text

After 30 years since its invention, magnetic force microscopy (MFM) represents a widespread and versatile method for the characterization of magnetic properties of materials at the nanoscale. Lateral resolution and  sensitivity to localized magnetic fields, together with the employment of a relatively simple setup without the need for complex or invasive sample preparations are among the main advantages of MFM. In recent years, also, the application contexts of MFM have been broadened and today include the study of magnetic filDRms and nanomaterials, also in complex matrices like biological structures, in air or liquid environment. At same time, MFM revealed some limitations to overcome which represent some of the current main challenges to take up in order to further improve applicability and accuracy of the technique. The state of the art, current limitations, challenges, and future perspectives are reviewed and described.