European Microscopy Congress 2020 Abstract Database

• Bayesian model selection for atom column detection from ABF-ADF STEM images

  Dr. Jarmo Fatermans, Dr. Ir. Arnold J. den Dekker, Dr. Nicolas Gauquelin, Prof. Dr. Johan Verbeeck, Prof. Dr. Sandra Van Aert

• Beam broadening of keV-electrons in matter calculated by numerical solution of the transport equation

  Dr. Erich Müller, M.Sc. Milena Hugenschmidt, Prof. Dagmar Gerthsen

• Beam-dose controlled atomic resolution EELS mapping of catalyst supports

  Trung D. Tran, Dogan Ozkaya

• Behavior and stability of PNIPAM hydrogel particles in liquid phase under electron irradiation

  Albert Grau-Caronell, Sina Sadighikia, Tom A. J. Welling, Prof. Dr. Alfons van Blaaderen, Dr. Marijn A. van Huis

• Benefits and recent techniques for high-resolution structural analysis of large volumes

  Ph.D. Ondřej Šulák, Ph.D. Jakub Javůrek, Ph.D. Kristýna Rosíková, Ing. Samuel Záchej, Ing. Jana Havránková

• Biogenic Mn(II)-coated UO2 nanoparticles: TEM experiment and modeling

  Dr Elena Suvorova

• Biophysical Contrast Mechanisms for Biomedical Imaging

  Assistant Professor Giuliano Scarcelli

• Bringing open microscopy to the Web of Things

  Dr Joel Collins, Joram Mduda, Dr Julian Stirling, Dr Richard Bowman

• Broad Argon Ion Beam (BIB) Milling to improve EBSD analysis of a nickelbase alloy using a modern Schottky FE-SEM

  Dr. Roland Schmidt

• Broadband coupling of fast electrons to high-Q whispering gallery mode resonators

  Niklas Müller, Vincent Hock, Holger Koch, Christopher Rathje, Prof. Dr. Sascha Schäfer

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