European Microscopy Congress 2020 Abstract Database

• C-means clustering of combined EDS and EBSD signals for materials analysis

  Dr Alexander Eggeman, Dr Joshua Einsle, Dr Benjamin Martineau, Dr Zoia Vukmanovic, Dr Giulio Lampronti, Prof Richard Harrison, Prof Paul Midgley

• Ca segregation towards an in-plane compressive strain Bismuth Ferrite – Strontium Titanate interface

  Ulrich Haselmann, Georg Haberfehlner, Weijie Pei, Maxim N. Popov, Lorenz Romaner, Daniel Knez, Jian Chen, Arsham Ghasemi, Yunbin He, Gerald Kothleitner, Zaoli Zhang

• Calculation of double differential cross sections for inner-shell excitations in the local density approximation

  Leonhard Segger, Prof. Dr. Helmut Kohl

• Cathodoluminescence and Electron Holography complementary studies of AlN/GaN nanowires

  Sophie Meuret, Luiz Tizei, Bruno Daudin, Christophe Gatel

• Caught in transition: Nanoscale analysis and molecular level characterisation of collagen mineralisation by complementary use of electron microscopy and in situ Raman microspectroscopy

  Emma Tong, Dr Brian Wingender, Professor Roland Kroger, Professor Laurie Gower, Dr Julia Parker

• Ceria-supported nickel catalyst for Sabatier reaction:  a detailed nanoscopy investigation

  Dr Maria Chiara Spadaro, Ms Viktoria Holovanova, Dr Teresa Andreu, Prof Dr Joan Ramon Morante, Prof Dr Jordi Arbiol

• Certified reference material NMIJ CRM 5207-a tungsten dot-array for image sharpness evaluation in scanning electron microscopy

  Dr. Kazuhiro Kumagai, Dr. Akira Kurokawa

• Challenges and perspectives of Transmission Kikuchi Diffraction in the SEM

  Dr. Alice Fanta

• Challenges in Electron Beam-Induced Current Imaging: from SEM-EBIC to STEM-SEEBIC

  Oscar Recalde, Alexander Zintler, Robert Eilhardt, Andreas Rummel, Leopoldo Molina-Luna

• Challenges in Exploring Epithelial Regeneration: 4D Quantification of Mitotic Spindle Movement in Mother Cells

  David Dang, Dr Nishanth Sastry, Prof Viji M. Draviam

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