European Microscopy Congress 2020 Abstract Database

Jump to:

View all A B C D E F G H I J K L M N O P Q R S T U V W X Y Z

ZnFe bimetallic nanoparticles: a detailed characterization by TEM and EELS

H. Lamsaf, V. Lenzi, L. Marques, L. Rebouta, S. Carvalho, S Calderon V
Zone axis EMCD with convergence angles corresponding to 1.2Å electron probes

Hasan Ali, Devendra Negi, Tobias Warnatz, Björgvin Hjörvarsson, Jan Rusz, Klaus Leifer